Laser Focusing X Ray Fluorescence Equipment With Automatic Three - Dimensional Sample Stage

EDXRF-UN3D energy dispersive X-ray fluorescence (ED-XRF) spectrometer redefines ED-XRF analysis with exceptional new levels of performance

Unicomp Technology EDXRF-UN3D Super X-ray fluorescence spectrometry (XRF) can analyze the thickness of coating fast without destruction, do not need any consumable material, and just need a very low maintenance cost .Usually finish analysis need only 30 seconds. The element of coating and the number of layers can be configured according to customer’s need. Core components - high-voltage power supply and X-ray detector are original imported. Special analysis EDXRF-UN3D Workstation software in addition to measure the coating thickness also do RoHS / ELV / halogen-free analysis.

Features

Automatic three-dimensional sample stage

3D X, Y, Z stepper motor control system, combined with camera management, enables sample movement through software control.

X-ray down-illumination, laser focusing

X-ray down-illumination design, laser focusing, for irregular shape samples, no need to split, can be tested directly.

Small spot design

The minimum spot is only 0.1mm, which can accurately locate small test points to avoid interference. According to customer requirements, any three collimators of Φ0.1mm, Φ0.3mm, Φ0.7mm and Φ3.0mm can be quickly selected. Meet the test needs of different size points in the sample.

Test time flexibility adjustment

Samples of different material types require different measurement times, and the length of measurement can be set according to the type of sample and the accuracy requirements of the customer. The outermost layer of the conventional coating test is better than ±5%, and the outer layer is better than ±10%.

Multi-spec sample warehouse

A variety of sample compartment sizes to meet a variety of sample testing needs!

Peripheral configuration